Field Emission Scanning Electron Microscopy (FESEM) - Energy Dispersive Spectroscopy (EDS)


FESEM: FEI Nova NanoSEM 450
EDS:Bruker XFlash 6I30
  • FESEM: Ultra High Resolution low voltage imaging and unique low vacuum capabilities.
  • Resolution:1.0 nm at15kV, 1.4 nm at 1kV &1.8 nm at 3kV and 30Pa
  • In-lens TLD, SE and BSE detection.
  • Equipped with Load lock (Quick Loader).
  • EDS EDS EDS EDS: Excellent energy resolution (123 eV at Mn Kα and 45eV at C Kα) & element detection range from 4 Be to 95Am.
  • Sample requirement: Powder, thin films, liquid samples by fixation on conducting surface.
  • Software: FESEM: xT microscope Control EDS: Espirit 1.9
  • Sputter Coater facility with sources Pt, Au, Cr and C
  • Applications: Microscopic feature measurements, Surface morphology, qualitative and quantitative elemental analysis, elemental mapping
  • In charge: Prof. S.W.Gosavi

    Contact: 020 - 25622710
    Email : This email address is being protected from spambots. You need JavaScript enabled to view it.
    Only for university campus users - To download requisition slip, click here - (Please submit this requisition slip duly filled and signed with samples)


Charges for FESEM-EDS Analysis: